Given that there is not yet an effective method for dealing with the zero-failure data in the accelerated life tests among engineering projects

a method for reliability analysis on the constant-stress zero-failure accelerated life test was proposed.This method can equivalently covert the zero failure data in the accelerated stress level to the normal stress level. Then

reliability assessment and life prediction on the product under zero-failure accelerated life test condition could be achieved in the normal stress by dealing with the converted data. Based on this method

analysis was conducted on the zero-failure accelerated life test data of one kind of satellite earth sensor pintle. The result shows that this method has well solved the problem of reliability assessment and life prediction when the product is subject to zero-failure accelerated life test by fully utilizing the information.