HU Bao-sen, SI Chang-jian, CHEN Qing-guo, et al. Dielectric Loss Factor of High Voltage Capacitive Apparatus Measurement Based on DSP[J]. 2010, 15(6): 21-24.
HU Bao-sen, SI Chang-jian, CHEN Qing-guo, et al. Dielectric Loss Factor of High Voltage Capacitive Apparatus Measurement Based on DSP[J]. 2010, 15(6): 21-24.DOI:
基于DSP的高压电容型电力设备介质损耗因数测量系统
摘要
介质损耗因数是反映电力系统中高压容性设备绝缘状况的重要参数
通过对介损因数的测量可以及时发现电力设备中的绝缘受潮、劣化变质与局部缺陷等问题
从而保证电力系统的安全运行.本文阐述了介质损耗因数测量的基本原理
并且以TI公司TMS320F2812 DSP为控制与处理核心
对系统的各部分进行了设计
包括:信号传感、调理、采集和校准等单元.测试结果表明
本文所设计的硬件系统和算法具有较好的介质损耗因数测量准确度和抗干扰能力等优点.
Abstract
Dielectric loss factor(tanδ) is a very important parameter which can reflect the insulating condition of high voltage capacitive apparatus in power systems.By measuring tanδ
the insulation moistened
deterioration and local defects of the power equipments can be found to ensure the safe operation of power system.In this paper the principle of dielectric loss factor measurement is introduced
and the hardware of the system based on TMS320F2812 is designed