CHEN Gao一ru, LIN Jia-qi, LI Dong-ping, et al. Mechanical and Electrical Proaerties of PI/AI}O} /SiO} Comaosite Films[J]. 2015, 20(2): 105-108.DOI:
PI/A1203 /Si0:杂化薄膜的力学及电学性能
摘要
采用原位聚合法制备掺杂无机粒子质量分数从1% }5%的PI/SiOZ/AlZ 0。纳米杂化薄膜.通过SEM发现无机纳米AlZ 03和纳米SiOZ颗粒在聚酞亚胺基体中有很好的相容性和分散性,其颗粒尺寸大约在100 nm左右.采用万能试验机和宽频介电谱分析仪研究不同浓度AlZ 03和Si0:的掺杂对PI薄膜的力学性能和电学性能的影响.当质量分数为3%的时候,杂化薄膜力学性能最佳,具有最大的拉伸强度(36. 143MPa)和断裂伸长率(10. 88% ).并且在100Hz下它相比于其它含量的杂化薄膜,具有最小的介电常数(6. 76 )、介电损耗(0. O1)和电导率(3. 94 x 10 -’Z S } m -’ ) .
Abstract
The PI/SiOZ/A1Z03 nanoparticles hybrid films with mass fraction rang from 1%to 5% had beensynthesized using the situ polymerization preparation method. Through scanning electron microscope(SEM)testingmeans,it was found that the inorganic A1Z03 nanoparticles and SiOZ nanoparticles have good compatibility and dis-persion in the polyimide matrix,and the size of A1Z03 nanoparticles and SiOZnanoparticles are about 100 nm. Theeffects of different doping concentrations on the mechanical and electrical properties of PI film were researched byuniversal testing machine and broadband dielectric spectroscopy analyzer. When the doping mass fraction was 3 %,the mechanical property of the hybrid film is optimal,and has a maximum tensile strength(36. 143 MPa)and