J.A. Sharon, K. Hattar, B.L. Boyce, 等. Compressive Properties of ⟨110⟩ Cu Micro-Pillars after High-Dose Self-Ion Irradiation[J]. 材料研究快报(英文), 2014,2(2):57-62.
J.A. Sharon, K. Hattar, B.L. Boyce, et al. Compressive Properties of ⟨110⟩ Cu Micro-Pillars after High-Dose Self-Ion Irradiation[J]. Materials Research Letters, 2014, 2(2): 57-62.
J.A. Sharon, K. Hattar, B.L. Boyce, 等. Compressive Properties of ⟨110⟩ Cu Micro-Pillars after High-Dose Self-Ion Irradiation[J]. 材料研究快报(英文), 2014,2(2):57-62.DOI: 10.1080/21663831.2013.859179.
J.A. Sharon, K. Hattar, B.L. Boyce, et al. Compressive Properties of ⟨110⟩ Cu Micro-Pillars after High-Dose Self-Ion Irradiation[J]. Materials Research Letters, 2014, 2(2): 57-62.DOI: 10.1080/21663831.2013.859179.
Compressive Properties of ⟨110⟩ Cu Micro-Pillars after High-Dose Self-Ion Irradiation
Single-crystal Cu micro-pillars were self-ion irradiated up to 190 displacements per atom
a level commensurate with damage expected after long exposure in a reactor environment. Compression experiments performed along the ⟨ 110 ⟩ to 10% strain were compared against un-irradiated Cu. Two specimen configurations were explored: large 10 μm tall and small 4 μm tall pillars. Compared to un-irradiated Cu
the small irradiated pillars exhibited a flow stress increase of more than 500 MPa and were able to attain peak stresses approaching 1 GPa. These results are discussed in the context of an end of range effect
a damage gradient effect
and size effects.
Abstract
Single-crystal Cu micro-pillars were self-ion irradiated up to 190 displacements per atom
a level commensurate with damage expected after long exposure in a reactor environment. Compression experiments performed along the ⟨ 110 ⟩ to 10% strain were compared against un-irradiated Cu. Two specimen configurations were explored: large 10 μm tall and small 4 μm tall pillars. Compared to un-irradiated Cu
the small irradiated pillars exhibited a flow stress increase of more than 500 MPa and were able to attain peak stresses approaching 1 GPa. These results are discussed in the context of an end of range effect