Operando diagnostic detection of interfacial oxygen ‘breathing’ of resistive random access memory by bulk-sensitive hard X-ray photoelectron spectroscopy
Original Report|更新时间:2026-08-19
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Operando diagnostic detection of interfacial oxygen ‘breathing’ of resistive random access memory by bulk-sensitive hard X-ray photoelectron spectroscopy
Operando diagnostic detection of interfacial oxygen ‘breathing’ of resistive random access memory by bulk-sensitive hard X-ray photoelectron spectroscopy
材料研究快报(英文)2019年7卷第3期 页码:117-123
作者机构:
1. IHP Im Technologiepark 25
2. Institute of Microelectronics Peking University
6. Department of Chemistry and 4D LABS Simon Fraser University Burnaby Canada
7. Electronic Materials Research Laboratory Key Laboratory of the Ministry of Education & International Center for Dielectric Research School of Electronic and Information Engineering Xi’an Jiaotong University
Gang Niu, Pauline Calka, Peng Huang, 等. Operando diagnostic detection of interfacial oxygen ‘breathing’ of resistive random access memory by bulk-sensitive hard X-ray photoelectron spectroscopy[J]. 材料研究快报(英文), 2019,7(3):117-123.
Gang Niu, Pauline Calka, Peng Huang, et al. Operando diagnostic detection of interfacial oxygen ‘breathing’ of resistive random access memory by bulk-sensitive hard X-ray photoelectron spectroscopy[J]. Materials Research Letters, 2019, 7(3): 117-123.
Gang Niu, Pauline Calka, Peng Huang, 等. Operando diagnostic detection of interfacial oxygen ‘breathing’ of resistive random access memory by bulk-sensitive hard X-ray photoelectron spectroscopy[J]. 材料研究快报(英文), 2019,7(3):117-123.DOI: 10.1080/21663831.2018.1561535.
Gang Niu, Pauline Calka, Peng Huang, et al. Operando diagnostic detection of interfacial oxygen ‘breathing’ of resistive random access memory by bulk-sensitive hard X-ray photoelectron spectroscopy[J]. Materials Research Letters, 2019, 7(3): 117-123.DOI: 10.1080/21663831.2018.1561535.
Operando diagnostic detection of interfacial oxygen ‘breathing’ of resistive random access memory by bulk-sensitive hard X-ray photoelectron spectroscopy
-based resistive random access memory (RRAM) is one of the most promising candidates for non-volatile memory applications. The detection and examination of the dynamic behavior of oxygen ions/vacancies are crucial to deeply understand the microscopic physical nature of the resistive switching (RS) behavior. By using synchrotron radiation based
non-destructive and bulk-sensitive hard X-ray photoelectron spectroscopy (HAXPES)
we demonstrate an operando diagnostic detection of the oxygen ‘breathing’ behavior at the oxide/metal interface
namely
oxygen migration between HfO
2
and TiN during different RS periods. The results highlight the significance of oxide/metal interfaces in RRAM
Breaking mixture rule of strength and ductility by interface induced nano-scale heterostructure in TA1/304 composites
Twin hopping in nanolayered Zr-2.5Nb
Role of interfacial transition zones in the fracture of Cu/V nanolamellar multilayers
Ni-P nanoglass prepared by multi-phase pulsed electrodeposition
Dose dependence of radiation damage in nano-structured amorphous SiOC/crystalline Fe composite
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