Quantification of local dislocation density using 3D synchrotron monochromatic X-ray microdiffraction

Guangni Zhou; Wolfgang Pantleon; Ruqing Xu; Wenjun Liu; Kai Chen; Yubin Zhang

doi:10.1080/21663831.2020.1862932

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Quantification of local dislocation density using 3D synchrotron monochromatic X-ray microdiffraction

Original Report | 更新时间：2026-08-19

- Quantification of local dislocation density using 3D synchrotron monochromatic X-ray microdiffraction
- Quantification of local dislocation density using 3D synchrotron monochromatic X-ray microdiffraction
- 材料研究快报（英文） 2021年9卷第4期页码：182-188
- 作者机构：
  
  1. a Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano) State Key Laboratory for Mechanical Behavior of Materials Xi’an Jiaotong University Xi’an People’s Republic of China
  2. b Department of Mechanical Engineering Technical University of Denmark
  3. c Advanced Photon Source Argonne National Laboratory Lemont
  4. a Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano) State Key Laboratory for Mechanical Behavior of Materials Xi’an Jiaotong University
- 作者简介：
- 基金信息：
- DOI：10.1080/21663831.2020.1862932
  中图分类号：
- 网络首发：2021-01-11，
  
  纸质出版：2021
- 稿件说明：
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Guangni Zhou, Wolfgang Pantleon, Ruqing Xu, 等. Quantification of local dislocation density using 3D synchrotron monochromatic X-ray microdiffraction[J]. 材料研究快报（英文）, 2021,9(4):182-188.

Guangni Zhou, Wolfgang Pantleon, Ruqing Xu, et al. Quantification of local dislocation density using 3D synchrotron monochromatic X-ray microdiffraction[J]. Materials Research Letters, 2021, 9(4): 182-188.
Guangni Zhou, Wolfgang Pantleon, Ruqing Xu, 等. Quantification of local dislocation density using 3D synchrotron monochromatic X-ray microdiffraction[J]. 材料研究快报（英文）, 2021,9(4):182-188. DOI： 10.1080/21663831.2020.1862932.

Guangni Zhou, Wolfgang Pantleon, Ruqing Xu, et al. Quantification of local dislocation density using 3D synchrotron monochromatic X-ray microdiffraction[J]. Materials Research Letters, 2021, 9(4): 182-188. DOI： 10.1080/21663831.2020.1862932.

摘要

Abstract

BSTRACTA novel approach evolved from the classical Wilkens’ method has been developed to quantify the local dislocation density based on X-ray radial profiles obtained by 3D synchrotron monochromatic X-ray microdiffraction. A deformed Ni-based superalloy consisting of

matrix and

′ precipitates has been employed as model material. The quantitative results show that the local dislocation densities vary with the depths along the incident X-ray beam in both phases and are consistently higher in the

matrix than in the

′ precipitates. The results from X-ray microdiffraction are in general agreement with the transmission electron microscopic observations.

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相关机构

d Materials Intelligent Innovation laboratory (MIIL) Beijing Institute of Technology

c National Key Laboratory of Science and Technology on Materials under Shock and Impact Beijing Institute of Technology Beijing People’s Republic of China

b Tangshan Research Institute Beijing Institute of Technology Tangshan People’s Republic of China

a School of Materials Science and Engineering Beijing Institute of Technology Beijing People’s Republic of China

a School of Materials Science and Engineering Beijing Institute of Technology

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