BSTRACTIn this work

by using multi-scale characterizations from electron channeling contrast imaging (ECCI) to atom probe tomography (APT)

we directly evidenced that the massive cracking events in the selective-laser-melted (SLMed) Haynes 230 superalloy are due to the continuous decoration of an M

23

C

6-

type thin film at grain boundaries. The high-melting-point nature of the carbide rules out the possibility of liquidation cracking

while the long and straight film surface facilitates stress-induced solid-state cracking. Impurities

Si

Mn and Fe

greatly enhance the cracking susceptibility despite the interesting fact that they are strongly depleted from the carbide.