According to difficult fault localization of virtual reconfigurable circuits (VRC) and large test times of traditional fault localization technology

a novel rapid fault localization technology of VRC based on improved binary search is proposed. When the scales of VRC are no more than two rows (or two columns)

fault PE can be located line by line (or column by column). When the scales of VRC are larger than two rows and two columns

the fault dubitable area of programmable elements (PE) can be confirmed by one row-test and one column-test

and then the test direction can be confirmed through the number of rows and columns of fault dubitable area. Eventually

fault dubitable area can be divided equally in the test direction

and two parts can be configured based on the theory of row-test and column-test. Faults can be located by "AND" operation of two parts. All faults PE can be located until fault dubitable area can not divided two parts. Compared with traditional VRC fault localization technology

the test performance analysis of fault localization proves that continuous distribution trouble-free PE can be detected and isolated by proposed VRC fault localization technology

and test area can be narrowed quickly. The test number of faults localization can be reduced

and the maximum test numbers are smaller than former. The average decrement of single and dual fault localization test number is more than 50%. The feasibility and validity of proposed improved rapid fault localization technology are proved

and it has definite generality and engineering application value.