基于差错概率传播模型的门级电路可靠度计算

欧阳城添; 陈莉莉

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基于差错概率传播模型的门级电路可靠度计算

更新时间：2026-09-04

- 基于差错概率传播模型的门级电路可靠度计算
- Reliability Calculation for Gate-level Circuit Based on Error Probability Propagation Model
- 微电子学与计算机 2018年35卷第3期页码：88-92
- 作者机构：
  
  江西理工大学机构信息工程学院,江西,赣州,341000
- 作者简介：
- 基金信息：
  
  国家自然科学基金项目 61561024国家自然科学基金项目 61462034国家自然科学基金项目 61563019江西省自然科学基金项目 20151BAB207035
- DOI：
  中图分类号：
- 纸质出版：2018
- 稿件说明：
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欧阳城添, 陈莉莉. 基于差错概率传播模型的门级电路可靠度计算[J]. 微电子学与计算机, 2018, 35(3): 88-92.

OUYANG Cheng-tian, CHEN Li-li. Reliability Calculation for Gate-level Circuit Based on Error Probability Propagation Model[J]. 2018, 35(3): 88-92.
欧阳城添, 陈莉莉. 基于差错概率传播模型的门级电路可靠度计算[J]. 微电子学与计算机, 2018, 35(3): 88-92. DOI：

OUYANG Cheng-tian, CHEN Li-li. Reliability Calculation for Gate-level Circuit Based on Error Probability Propagation Model[J]. 2018, 35(3): 88-92. DOI：

摘要

提出了一种差错概率传播模型

该方法首先将逻辑门的差错概率加载到连接导线上进行计算

再逐个计算逻辑门的正确输出概率

最后计算得到整个电路的可靠度.与传统概率转移矩阵方法比较

所提出的改进方法有效地减小了时间和空间复杂度

能适用于大规模电路的可靠性评估.

Abstract

This paper builds a conductor error PTM propagation model

the logic gate of error PTM loading onto the wires are calculated

computed the correct logic gate output probability

finally a layer of door correct output probability is calculated

the probability is the reliability of the entire circuit. This method effectively reduces the time and space complexity

can apply to the reliability evaluation of VLSI circuit by comparing with traditional PTM.

关键词

Keywords

references

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欧阳城添. 时序电路逻辑级可靠度评估方法研究[D]. 上海: 同济大学, 2013.

肖杰, 江建慧, 朱旭光. 一种基于迭代PTM模型的电路可靠性评估方法[J]. 计算机学报, 2014, 37 (7) : 1508-1520. DOI: 1508

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