单粒子多瞬态诱导的组合电路软错误敏感性评估

鄂长江; 李少甫; 齐艺轲

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单粒子多瞬态诱导的组合电路软错误敏感性评估

更新时间：2026-09-04

- 单粒子多瞬态诱导的组合电路软错误敏感性评估
- Soft error sensitivity estimation of single event multi-transient induced combination circuits
- 微电子学与计算机 2019年36卷第11期页码：16-19
- 作者机构：
  
  西南科技大学机构信息工程学院,四川,绵阳,621010
- 作者简介：
- 基金信息：
  
  国家自然科学基金 U1830201四川省科技计划项目 2017JY0050
- DOI：
  中图分类号：
- 纸质出版：2019
- 稿件说明：
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鄂长江, 李少甫, 齐艺轲. 单粒子多瞬态诱导的组合电路软错误敏感性评估[J]. 微电子学与计算机, 2019, 36(11): 16-19.

E Chang-jiang, LI Shao-fu, QI Yi-ke. Soft error sensitivity estimation of single event multi-transient induced combination circuits[J]. 2019, 36(11): 16-19.
鄂长江, 李少甫, 齐艺轲. 单粒子多瞬态诱导的组合电路软错误敏感性评估[J]. 微电子学与计算机, 2019, 36(11): 16-19. DOI：

E Chang-jiang, LI Shao-fu, QI Yi-ke. Soft error sensitivity estimation of single event multi-transient induced combination circuits[J]. 2019, 36(11): 16-19. DOI：

摘要

为了评估数字电路的软错误敏感性

研究了一种适于FPGA的单粒子多瞬态(SEMT)诱导的组合电路软错误评估方法.考虑脉冲传输过程中受到的电气屏蔽的影响和辐射粒子入射的随机性

控制不同脉宽的SEMT脉冲对所有SEMT故障位置进行故障注入

统计错误结果.实验结果表明

该方法能对单粒子两个及以上瞬态诱导的组合电路软错误敏感性进行分析

得到各故障位置敏感度信息

供电路设计前端参考改进.

Abstract

In order to evaluate the soft error sensitivity of digital circuits

a single event multi-transient (SEMT) induced soft error analysis system for combinational circuits based on FPGA is proposed. Considering the influence of electrical shielding and the randomness of incident radiation particles in the process of pulse transmission

we control the different pulse width of the SEMT pulse to inject all the fault locations of the SEMT

and statistics the error results. The experimental results show that the system can analyze the soft error sensitivity of two or more transient induced combinational circuits. The sensitivity information of each fault location can be obtained

and the front-end of power supply circuit design can be improved.

关键词

Keywords

references

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RAO R R, CHOPRA K, BLAAUW D T, et al. Computing the soft error rate of a combinational logic circuit using parameterized descriptors[J]. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2007, 26(3):468-479. DOI: 468

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周婉婷, 靳丽娜, 叶世旺.单粒子瞬态效应硬件注入模型实现和仿真[J].微电子学与计算机, 2014, 31(9):84-87. DOI: 84

武振平, 付方发, 肖立伊.基于VHDL故障注入的处理器敏感性分析[J].微电子学与计算机, 2012, 29(10):51-54. DOI: 51

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